New Patent Examiner Reward System
Posted Thursday, October 01, 2009 by Jim Ruttler.
The US Patent Office has released an update to the Examiners providing details on the new reward system. The system will incentivize examiners to identify allowable subject matter on the first office action and should reduce overall pendency of applications. Further, there will be a new formal policy of requiring examination on a first-in first-out basis. This is excellent news for applicants as these policies should help provide more compact examination and earlier allowance for truly novel inventions.
Quick Links
Blog Archive
- 2013 (8)
- April (2)
- March (1)
- February (2)
- January (3)
- 2012 (44)
- December (2)
- November (3)
- October (3)
- September (4)
- August (3)
- July (3)
- June (4)
- May (3)
- April (3)
- March (6)
- February (6)
- January (4)
- 2011 (16)
- December (3)
- November (1)
- October (3)
- September (1)
- August (3)
- January (5)
- Ex Parte Bozionek, Appeal 2010-000479 (BPAI 2011). Judge Jordan.
- Ex Parte O'Keefe, Appeal 2010-000479 (BPAI 2011). Judge Staicovici.
- Aktiengesellschaft, Appeal 2009-014,596 (BPAI 2111). Judge Delmendo.
- Ex Parte Arnoldy,Appeal 2009-01008 (BPAI 2011). Judge Fetting.
- Ex parte Isoyama, Appeal 2009-006066 (BPAI 2011). Judge Courtenay III.
- 2010 (32)
- September (1)
- August (2)
- July (3)
- June (5)
- May (5)
- April (6)
- March (2)
- February (2)
- January (6)
- 2009 (44)
- December (6)
- November (5)
- October (2)
- September (5)
- August (4)
- July (6)
- June (2)
- May (2)
- April (3)
- March (5)
- February (4)
- 2008 (19)
- October (2)
- August (2)
- July (1)
- June (3)
- May (2)
- April (2)
- March (1)
- February (3)
- January (3)
- 2007 (10)
- December (1)
- November (2)
- October (3)
- September (4)
Contact